Light-Solution
Beam'R2 – XY Scanning Slit Beam Profiler
190 to 1150 nm, Silicon detector
650 to 1800 nm, InGaAs detector
1000 to 2300 or 2500 nm, InGaAs (extended) detector
Beam diameters 5 µm to 4 mm, to 2 µm in Knife Edge mode
Port-powered USB 2.0; flexible 3 m cable; no power brick
0.1 µm sampling and resolution Linear & log X-Y profiles, centroid Profile zoom & slit width compensation Economical and accurate M² option – beam propagation analysis, divergence, focus
Applications
Laser printing & marking
Medical lasers
Diode laser systems Fiber optic telcom assembly focusing – LensPlate2™ option for re-imaging waveguides and fiber ends
Development, production, field service
CW; Pulsed lasers, Φ µm ≥ [500/(PRR in kHz)]
M² measurement with available M2DU stage
